Information about product failure based on chip manufacturing process contamination is given below. Let F denote the event that the product fails. Let H denote the event that the chip is exposed to high contamination during manufacture.
a) Find P(F | H) , P(H) , P(F∩H) .
b) Obtain P(F | H') , P(H) , P(F ∩ H') .
c) P(F) .