1) Reliability tests of a certain type of device indicate its failures fit a Weibull distribution with shape parameter 1 . To determine its reliability 700 of them were subjected to stress testing under simulated-like conditions. After 4 years, 5 parts have failed.
a) Calculate the number of these devices expected to survive after 10 years.
b) Calculate the number of devices expected to fail after 10 years.
c) Calculate the probability (in percentage) that a particular device will survive after 10 years.
d) Calculate the probability (in percentage) that a particular device will fail after 10 years.
e) Calculate the probability density of failure after 10 years.